Publication of the journal

The section is currently being updated

Articles

ELECTRONICS MATERIALS

  • The contactless non-destructive method makes possible the determination of the concentration of free electrons in the indium antimonide samples by room temperature far infrared reflection spectra. The computer program, giving the possibility to deter...

Authors: Irina M. Belova, Aleksandr G. Belov, Vladimir E. Kanevsky, Aleksandr P. Lysenko
201 - 210

Technological processes and routes

  • Epitaxial processes on large diameter substrates are characterized by defective formation of the peripheral areas due to plastic deformation. The formation of zones of plastic deformation depends on the distribution of temperature stress and method o...

Authors: Anatoliy A. Kravchenko, Anatoly I. Pogalov
211 - 219

INTEGRATED ELECTRONICS ELEMENTS

  • The reasons and mechanisms of Change of the quantum efficiency and other characteristics of InGaN/GaN in various operation conditions are actively being investigated. The results of experimental research of changes of the external quantum efficiency ...

Authors: Viacheslav A. Sergeev, Ilya V. Frolov , Aleksey A. Shirokov, Oleg A. Radaev
220 - 230
  • For multi-factor analysis of instrument characteristics of the field-effect Hall sensor on the SOI structure (SOI FEHS), by means of the TCAD simulation, the calculation of the output and transfer characteristics of SOI FEHS) two-dimensional model ha...

Authors: Mikhail A. Korolev , Anton V. Kozlov, Anton Yu. Krasyukov , Svetlana S. Devlikanova
231 - 237
  • In production of the rad-hard electronic components base it is necessary to pay specific attention to single event effects because of the constantly increasing density of components on a chip. The effect of the embedded deep insulating N-well in 90-n...

Authors: Kirill A. Panyshev, Yuriy A. Parmenov
238 - 246

CIRCUIT ENGINEERING AND DESIGN

  • The voltage doublers on the switched capacitors are the commonly used impulse voltage converters. Using the mathematical modeling of transient processes the formulas, permitting to design the scheme of the voltage doubler on the switched capacitors w...

Authors: Yuriy Yu. Razuvaev
247 - 255
  • By architectural solutions the new domestic FPGAs take an intermediate position between the low-budget series Altera Cyclone II and high-performance series Stratix III. The structure of the type programmable gate arrays with the logical blocks on the...

Authors: Andrey V. Strogonov, Pavel S. Gorodkov
256 - 265
  • The existing means for designing automation are oriented, mainly, at technologies of western manufactures. As a result, a need in adaptation of available methods and means of designing the reconfigurable systems on chip and development of domestic sp...

Authors: Sergey V. Gavrilov , Daniil A. Zheleznikov , Vasiliy M. Khvatov
266 - 275

MICRO- AND NANOSYSTEM TECHNOLOGY

  • When designing MEMS accelerometers, it is necessary to provide the high sensitivity of the instrument, which is directly related to the amplitude of deflection of the inertial mass under the acceleration effect. The inertial mass increase results in ...

Authors: Aung Thura, Boris M. Simonov, Sergey P. Timoshenkov
276 - 284

INTEGRATED RADIOELECTRONIC DEVICES

  • The most important units of the frequency formers are the frequency multipliers. The possibility of creating a microwave high multiplicity frequency multiplier with the built-in microwave switch on n - i - p - i - n -diode has been considered. For al...

Authors: Dmitriy A. Usanov, Aleksandr V. Skripal, Viktor N. Posadsky, Vitaliy S. Tyazhlov, Dmitriy V. Grigoriev
285 - 291
  • Small space vehicles are intended for investigations of the Earth, the Moon, the Mars and, also, for organization of communication. The up-to-date approach to making up a section of specifications has been considered. This approach regulates the test...

Authors: Pavel Yu. Vatskov
292 - 298

124498, Moscow, Zelenograd, Bld. 1, Shokin Square, MIET, editorial office of the Journal "Proceedings of Universities. Electronics", room 7231

+7 (499) 734-62-05
magazine@miee.ru