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Articles

ELECTRONICS MATERIALS

  • Metal nanoparticles are promising objects of research, since their properties are significantly different from the bulk material. When analyzing nanoparticles, it is important to study their size, stability, structural features and spatial arrangemen...

Authors: Yana S. Grishina, Nikolay I. Borgardt, Roman L. Volkov , Dmitriy G. Gromov, Andrey I. Savitskiy
543 - 556

Technological processes and routes

  • For most commonly used semiconductor materials the contact metal systems, giving low-resistance ohmic contacts and their formation methods are known and investigated. For the materials, relatively recently applied for serial production of semiconduct...

Authors: Vladimir I. Egorkin, Valeriy E. Zemlyakov, Aleksei V. Nezhentsev, Vladimir A. Gudkov, Valentine I. Garmash
557 - 564
  • For creating DRAM and flash-memory alternative of existing element base there are the memristive structures, based on resistance switching. In the paper the results of the study of formation features of creating the memristive structures based on cop...

Authors: Alexey N. Belov, Alexander A. Golishnikov , Artem M. Mastinin, Alexey A. Perevalov , Vasily I. Shevyakov
565 - 572

INTEGRATED ELECTRONICS ELEMENTS

  • Currently, the matrix photo-sensing devices (photosensors) are the main element of the medical digital X-ray imagers (commonly called detectors). Since the cost of a medical diagnostic mistake is very high, the requirements for a photosensor are as s...

Authors: Dmitry A. Suponnikov, Andrey N. Putilin, Elena A. Tatarinova, Zaur G. Zhgunev, Anatoly R. Dabagov
573 - 585

CIRCUIT ENGINEERING AND DESIGN

  • The process of creating the perspective radio engineering systems (RES) is connected not only with the search for original ideas and solutions, but, also, with the evaluation of their efficiency from positions of the engineering, technological and in...

Authors: Nikolay L. Dembitsky, Alexander M. Petrakov, Vyacheslav A. Shevtsov
586 - 594

INFORMATION-COMMUNICATION TECHNOLOGIES

  • The basis of the operating analysis of the state on the air is an average energy detector in singled out frequency band, determining presence/absence of the determined signals and stationary noises of any type in the channels of specified width. The ...

Authors: Vyacheslav А. Galkin
595 - 604
  • The 3D lookup tables (3DLUT) are used for speeding up the sophisticated nonlinear operations. They are commonly used in displays and other output devices for color processing, in particular, the gamut mapping operations for images and video. However,...

Authors: Dmitry V. Makarov, Mikhail K. Tchobanou
605 - 614

Brief reports

  • The composite materials based on poly[2-methoxy-5-(2ethylhexyoxy)-1,4-phenylevinylen] and titanium dioxide are promising for application in the opto-electronic and chemical industries. In connection with this the studies on behavior of chemical bonds...

Authors: Ivan A. Belogorokhov, Lyubov I. Belogorokhova
615 - 619
  • The transition to the macro- and nanosized elements in semiconductor electronics significantly increases the contribution of the surface layers to physico-chemical properties of materials. In its turn, the surface characteristics are affected, for ex...

Authors: Oleg G. Ashkhotov, Soslan A. Khubezhov, Irina B. Ashhotova
620 - 624
  • The micromechanical accelerometers (MMA) find more common application in the information-measuring and opto-electronic systems. The parameters and characteristics of MMA are determined by their design and manufacturing technology, the MMA functioning...

Authors: Boris M. Simonov, Vladimir N. Goroshko , Aleksey S. Timoshenkov
625 - 629
  • The results of studying the field emission properties of various conductors show the perspective of their use in the devices of microelectronics, X-ray tubes and light sources. For smooth conductor surfaces with an electron work function of about 2 t...

Authors: Zalim M. Khamdokhov, Eldar Z. Khamdokhov, Ruslan Sh. Teshev, Mukhamed D. Bavizhev, Zaur Ch. Margushev
630 - 634
  • The parameters of low-frequency (LF) noise with a look spectrum G ( f ) ~1/ f are widely used for diagnostics of quality and reliability of semiconductor devices. For metrological support of the gages for the LF-noise parameters the problem of devel...

Authors: Viacheslav A. Sergeev, Sergei E. Rezchikov
635 - 639

3 стр. обложки - 

Conferences

640 - 642
643 - 643

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