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Some specific features of the device-technological simulation have been considered. The results of the simulation and optimization of the integrated magnetosensitive elements as a part of micro- and nanosystems have been considered. The results of the simulation and optimization of the constructive -technological parameters for magnetosensitive transistors, Hall integrated elements, formed within the CMOS technology standards and the field Hall sensor based on the SOI technology as well as the characteristics of magnetic field concentrators have been presented.
Yury A. Chaplygin
National Research University of Electronic Technology, Moscow, Russia

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