Persons
Dr. Sci. (Eng.), Prof., Director of the Institute of Nano- and Microsystem Technology, National Research University of Electronic Technology (Russia, 124498, Moscow, Zelenograd, Shokin sq., 1)
Article author
The equations for estimation of the true leak rate for the hermiticity testing of microelectronic devices and MEMS have been proposed.
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Two approaches used for justifying the reliability models - the physical-probabilistic and physical-statistical ones - have been considered. The equivalence of both approaches has been shown. Using the methods of individual forecasting, the assessment of the probability of the non-failure operation of the linear acceleration converter (PLD) sample using both methods has been made and it has given the same results.
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