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Currently, there are a lot of the methods for structuring the luminophore coatings and screens, however, the studies, oriented to a search for more technological methods of structuring, are being conducted. Based on literary sources, a comparative analysis of the existing methods for structuring the luminophore coatings has been performed, the main principles of structuring scintillators have been determined and the most promising methods of modifying and structuring have been selected. The following methods for structuring the phosphor coatings have been considered: structuring the scintillation screen by disintegrating the luminophore from the colloidal solution onto the polymer matrix; structuring the scintillation screen by forming a luminophore composite on polymer matrix by mechanical deposition; structuring the scintillation screen by the method of filling the preliminarily formed cells on a silicon wafer; direct structuring of laser scintillation screen; auto-structured luminophores; formation of luminophore structures by layered 3D printing methods; structuring the scintillation screen by the method of differentiated luminophor disposition onto a previously prepared surface; ncreasing the resolution of the scintillation screen by EMA-borrowed methods (EMA - Enhanced Mutual Absorption, Improved Total Absorption). In the methods of the X-ray photodetector stacking two main variants have been identified that are of the greatest importance for creating the promising large-sized and inexpensive detectors. Self-organization of the structural elements of the luminophore layer allows creating the optical anisotropic wave-like structures with a good transverse optical limitation. Formation of anisotropic optical properties of the luminophore layer due to the addition of nanoparticles or spatial elements to the luminophore composition, with further structuring effect on them of an external magnetic or electric field, which provides the creation of luminophores with high anisotropic characteristics.

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The conversion stack is the most technologically complicated optical element of the X-ray sensitive panels used in the digital X-ray technology, which causes an increased attention to the optimization of the stack design, both in terms of the technical parameters of the panel and in terms of its process ability. The computer modeling of optical stacks of the X-ray radiation conversion, using various methods of immersion, bleaching and the technologically conditioned surface has been presented. A mathematical model of the optical transducer stack, which is a set of the functional layers of various thicknesses, has been developed. The main elements that can be a part of the conversion stack have been considered: a scintillator; an optically transparent adhesive for the scintillator; fiber optic plate; an optically transparent adhesive for a fiber optic plate; protective antireflection coating of the photo-reading device; the passivation layer of the photo-reading device. The variants of the construction of the investigated stacks, which has made it possible to compare the experimental data on the work of traditional methods of stacking for X-ray diffraction and to assess the adequacy of the used model, have been proposed. A mathematical model of an optical converter stack, geometrically representing a set of various thicknesses, has been developed. The top layer is exposed to X-rays. The lower layer is a photosensitive cell. The proposed model permits to affectively study the parameters of the optical stack to change the parameters of its components and, thus, to formulate the recommendations on the parameters of adhesives and protective coatings.

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