The conversion stack is the most technologically complicated optical element of the X-ray sensitive panels used in the digital X-ray technology, which causes an increased attention to the optimization of the stack design, both in terms of the technical parameters of the panel and in terms of its process ability. The computer modeling of optical stacks of the X-ray radiation conversion, using various methods of immersion, bleaching and the technologically conditioned surface has been presented. A mathematical model of the optical transducer stack, which is a set of the functional layers of various thicknesses, has been developed. The main elements that can be a part of the conversion stack have been considered: a scintillator; an optically transparent adhesive for the scintillator; fiber optic plate; an optically transparent adhesive for a fiber optic plate; protective antireflection coating of the photo-reading device; the passivation layer of the photo-reading device. The variants of the construction of the investigated stacks, which has made it possible to compare the experimental data on the work of traditional methods of stacking for X-ray diffraction and to assess the adequacy of the used model, have been proposed. A mathematical model of an optical converter stack, geometrically representing a set of various thicknesses, has been developed. The top layer is exposed to X-rays. The lower layer is a photosensitive cell. The proposed model permits to affectively study the parameters of the optical stack to change the parameters of its components and, thus, to formulate the recommendations on the parameters of adhesives and protective coatings.
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