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Иванников Александр Дмитриевич
Dr. Sci. (Eng.), Prof., Head Scientist of CAD Department of Institute for Design Problems in Microelectronics of Russian Academy of Sciences (Russia, 124365, Moscow, Zelenograd, Sovetskaya st., 3)

Article author

For digital microelectronic system design debugging, it is necessary to form a certain set of test influences on the simulated system to verify the correctness of its functioning. For a large number of digital systems, a sequence of functions from a finite alphabet is characteristic. It is shown that a partial semigroup is defined on the set of admissible sequences of functions. Valid sequences are formalized by introducing a graph of functions that defines the functions that can be performed for various states of the digital system. The function graph, together with the sets of input interactions for each function, specifies the specification of the external behavior of the digital system. If the admissibility of the sequential execution of two functions depends on previously performed functions and the state of the digital system, then some functions should be divided into subfunctions. It has been shown that a set of debugging tests should include both checking the execution of sequences of functions and the correctness of each function with various sets of parameters

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