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Романов Александр Аркадьевич

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To increase the functioning operating range of CMOS LSI, designed according to the radiation-resistant technology SOS, an increase of the breakdown voltages pf the N-channel MOS transistors is required. The results of the construction modernization and that one of the technological route of formation of N-MOS transistors with an improved breakdown voltage, obtained by means of the device-technological modeling TCAD Synopsys, have been presented.

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