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The voltage-current (VC) and lux-current (LC) room temperature characteristics of high-ohmic CdTe (CT) and Cd1-YZnYTe (CZT) samples with various illumination intensities have been investigated. The dependencies of the short-circuit current and open-circuit voltage with light intensity, when the CT and CZT-samples were illuminated by 740-nanometer red color radiation, have been also investigated. It has been shown that the lux-current characteristics of zinc cadmium telluride sample depend on the applied voltage polarity; the voltage-current characteristics strongly depend on the light intensity and have peculiar fracture at the coordinate zero-point. It has been assumed that within the sample the introduced electric field due to the technological ingot growth and annealing conditions exists.

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