Persons

Effective diagnostic method of quality control of the digital integrated circuits (DIC) is measurement of their thermal parameters. Values of thermal parameters of real products are defined by quality of their production and can significantly differ from calculated values. A method for measuring the transient thermal characteristics (TTC) of the digital integrated circuits (DIC) with the temperature dependence of the frequency of the DIC ring oscillator has been described. An iterative algorithm for calculating parameters of the linear one-dimensional Foster thermal circuit uses the values of TTC, which correspond to the zeros of the TTC second derivative, has been shown. The algorithm was tested in determining the zeros of the second derivative of TTC by direct numerical differentiation method and by differentiating the 9-th order polynomial approximating function. It has been shown that TTC of the tested DIC corresponds to the three-stage thermal circuit. Both methods of calculation give almost identical values of thermal parameters of the thermal scheme which well corresponds to different technological layers of the DIC structure.

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