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Some features of the thermal stabilization for the scanning probe microscopy devices have been studied. The universal microcontroller with the internal thermal stabilization has been developed. The device provides an improved accuracy of the temperature control during measurements.
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The method for reducing speed of the thermo drift of a probe relative to the sample has been developed. The method works together with the known methods of the thermo drift speed reduction. The method is based on the temperature stabilization of the electronic control system and the data read-out.
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