The comparative analysis of conventional and new CMOS differential amplifier circuits (DA) has been conducted for the models of the CMOS transistors not exposed to the gamma-ray source with a cumulative dose of 1 Mrad. The analysis of results have shown that the best resistance to ionizing radiation (IR) has been observed for asymmetric DA with the self-bias circuits, for which the change of the amplification coefficient after exposure was less than 5%, the in-phase output signal bias was less than 0.1 V and of symmetric DA, built based on two asymmetric amplifiers with the counterphase input signals and independent static mode stabilization.
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