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Wang Yuxuan

Xidian University of Electronic Science and Technology, Xi’an, China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)
Postdoctoral student of the Faculty of Integrated Circuits, Xidian University (China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)

Li Guoliang

Xidian University of Electronic Science and Technology, Xi’an, China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)
Research Associate of the Faculty of Integrated Circuits, Xidian University (China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)

Shan Guangbao

Xidian University of Electronic Science and Technology, Xi’an, China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)
Dr. Sci., Prof. of the Faculty of Integrated Circuits, Xidian University (China, 710126, Xi’an, Shaanxi, 266 Xinglong Section of Xifeng Road)

Ronald Ssali

National Research University of Electronic Technology, Russia, 124498, Moscow, Zelenograd, Shokin sq., 1
PhD student of the Institute of System and Software Engineering and Information Technologies, National Research University of Electronic Technology (Russia, 124498, Moscow, Zelenograd, Shokin sq., 1)

Maria V. Slyusar

National Research University of Electronic Technology (Russia, 124498, Moscow, Zelenograd, Shokin sq., 1)
PhD student, Assistant of the Institute of System and Software Engineering and Information Technologies, National Research University of Electronic Technology (Russia, 124498, Moscow, Zelenograd, Shokin sq., 1)
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