The micromechanical accelerometers (MMA) find more common application in the information-measuring and opto-electronic systems. The parameters and characteristics of MMA are determined by their design and manufacturing technology, the MMA functioning...
The results of studying the field emission properties of various conductors show the perspective of their use in the devices of microelectronics, X-ray tubes and light sources. For smooth conductor surfaces with an electron work function of about 2 t...
The parameters of low-frequency (LF) noise with a look spectrum G ( f ) ~1/ f are widely used for diagnostics of quality and reliability of semiconductor devices. For metrological support of the gages for the LF-noise parameters the problem of devel...