Persons

Меликян Вазген Шаваршович
Corresponding Member of the National Academy of Sciences of the Republic of Armenia, Dr. Sci. (Eng.), Prof., Head of the Microelectronic Circuits and Systems Department, National Polytechnic University of Armenia (Armenia, 0009, Yerevan, Teryan st., 105), Director of the University Programs, “Synopsys Armenia” CJSC (Armenia, 0026, Yerevan, Arshakunyats ave., 41)

Article author

The well known solution of the signal reflection is the transmission line matching method usage, where the resistance calibration problem comes forward. The transmission line matching occurs in I/O circuits, the number of which per IC can be more than 40, therefore, the area reduction of those is critical. In existing transmission line matching systems the multiple functional nodes, such as the current source, multiplexer, comparator, etc., have been used. Replacing those by other functional nodes can result in a significant area reduction, but can affect the resistance calibration accuracy. In the work the method for calibration of resistances, where the input signal feeds through a voltage follower, which output is connected to the «decision-making system», determining whether the controlled resistance value should be increased or decreased, has been proposed. Usage of the given method 1.6 times reduces the occupied area, with the resistance calibration accuracy reduction of 1%.

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