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The researches directed at the correlation revealing between the radhard integrated circuits technological process instability and their radiating sensitivity have been carried out. The influence of the epilayer thickness and conductivity, the active area doping and the initial heterostructures parameters on the IC's radiation sensitivity has been considered.
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The structure of the hardware-software system for the radiation tests of the electronic component base, which has been realized based on the National Instruments hardware platform and the LabView programming environment, has been considered. The complex provides the control of radiation facilities, the operating mode setting and the functionality control of tested devices, the testing results post-processing.
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