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The formation conditions and the methods to detect the multiple-bit upsets in static random access memory caused by single charged particles of space have been determined. The topical problems, which solution is necessary for development of the fault tolerant and reliable new generation space equipment, have been defined.
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The structure of the hardware-software system for the radiation tests of the electronic component base, which has been realized based on the National Instruments hardware platform and the LabView programming environment, has been considered. The complex provides the control of radiation facilities, the operating mode setting and the functionality control of tested devices, the testing results post-processing.
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