Persons

The possibility of determination of thickness and electro-physical parameters of thin nanometer and sub-micrometer dielectric and metal films in the sandwich-like structures, using the results of measurements on the reflection and transmission spectra of optical and microwave radiation, has been shown. The measurement results for the refractive index of SnO films in the thickness range from 40 nm to 2,8 µm, and the conductivity of cuprum films applied to the glass substrates have been presented.

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