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An approach to development of the digital CMOS IC's functional and parametric control in the tests on resistance to the single nuclear particles effect, allowing and improvement of the confidence of the independent detection of single-event upsets and thyristor effects, has been described.
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The structure of the hardware-software system for the radiation tests of the electronic component base, which has been realized based on the National Instruments hardware platform and the LabView programming environment, has been considered. The complex provides the control of radiation facilities, the operating mode setting and the functionality control of tested devices, the testing results post-processing.
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