The most commonly used methods and facilities for electronic component base SEE testing have been discussed. The main limitations of these methods and devices applicability have been presented. The recommendations on the choice of composition and seq...
An approach to development of the digital CMOS IC's functional and parametric control in the tests on resistance to the single nuclear particles effect, allowing and improvement of the confidence of the independent detection of single-event upsets an...
The structure of the hardware-software system for the radiation tests of the electronic component base, which has been realized based on the National Instruments hardware platform and the LabView programming environment, has been considered. The comp...