Analog Test Bus Commutation Cell for Measurement of Internal Signals in Integrated Circuits

Analog Test Bus Commutation Cell for Measurement of Internal Signals in Integrated Circuits

The analog cell for the test bus commutation has been described. The proposed solution has the following advantages: small and constant capacitance, a wide range of input voltages, wide bandwidth and small layout size. These advantages give the possibility to investigate the internal analog signals of integrated circuits, including the sensitive points of the operational amplifiers, while testing.
Dmitriy S. Latnikov
Saint Petersburg branch of "ELMOS Design Services B.V." company, Saint Petersburg. Russia
Mikhail S. Miropolskiy
Saint Petersburg branch of "ELMOS Design Services B.V." company, Saint Petersburg. Russia
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