A new approach in the high-precision measurement of the time parameters of the digital library cells, fabricated using the nanometer manufacturing process of semiconductor factories, has been described. The high precision of measuring the time parameters of the digital logic gates plays an important role during the simulation of the digital circuits using the advanced computer-aided design (CAD) and contributes to the successful start of the test chip. The picoseconds accuracy is provided by the time to digital on-chip converter and opens wide horizons for development of the measurement on-chip systems in the microelectronics industry.