Proceedings of universities. Electronics Electronics home

Том. 28 №5

Contents

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Technological processes and routes

Simulation of material sputtering and gallium implantation during focused ion beam irradiation of silicon substrate

Authors: O. V. Podorozhniy, A. V. Rumyantsev, R. L. Volkov, N. I. Borgardt

555 - 568

Integrated electronics elements

Vacuum nanoelectronics based on semiconductor field emission structures: current state and development prospects. Review

Authors: N. A. Djuzhev, I. D. Evsikov

569 - 599

Study of the thermoelectric properties of powerful MOSFETs

Authors: V. I. Smirnov, A. A. Gavrikov

600 - 611

circuit engineering and designing

System for automated IC design based on generative adversarial and artificial deep neural networks

Authors: V. Sh. Melikyan, A. V. Vardumyan, A. G. Harutyunyan, N. A. Asatryan, Shavarsh V. Melikyan, E. Y. Karapetyan

612 - 620

Two-dimensional simulation of emitter p–n+ junction of a silicon n–p–n transistor in rectangular and cylindrical coordinate systems

Authors: N. L. Lagunovich

621 - 628

Input stages of programmable high-speed operational amplifiers based on the master slice array MH2XA031

Authors: O. V. Dvornikov, V. A. Tchekhovski, N. N. Prokopenko, V. E. Chumakov

629 - 641

micro- and nanosystem technology

Investigating the influence of vacuum degree on merit factor of oscillating circuit of MEMS sensor sensitive element

Authors: S. P. Timoshenkov, Timoshenkov A.S., Anchutin S.A., Kochurina E.S., Dernov I.S., A. S. Musatkin, A. A. Lebedev

642 - 648

integrated radioelectronic devices

Miniature frequency standard based on CPT in Cs

Authors: A. F. Kurchanov, S. N. Slyusarev, S. N. Ovchinnikov, A. S. Salnikov

649 - 658

Information-communication technologies

Application of (0, μ) convoluted product of multidimensional matrices for graph theory problems solving

Authors: A. I. Makarov, V. I. Munerman

659 - 669

Self-dual fault-tolerant structures with calculations checking by parity code I. Structures based on duplication and the Boolean signals correction method

Authors: D. V. Efanov, T. S. Pogodina

670 - 686

A method for automated testing of consumer electronics devices using remote procedure calls and cloud services

Authors: L. G. Gagarina, A. V. Bukarev

687 - 699

Latest issue

Electronics

Journal release schedule

№1
Date of publication: february
№2
Date of publication: april
№3
Date of publication: june
№4
Date of publication: аugust
№5
Date of publication: october
№6
Date of publication: december

News

23.10.2023 Vol. 28, no. 5, 2023 has been published

Dear colleagues!
We are pleased to inform you that latest issue of scientific and technical journal "Proceedings of Universities. Electronics", vol. 28, no. 5, 2023 has been published on October 23, 2023.

23.08.2023 Vol. 28, no. 4, 2023 has been published

Dear colleagues!
We are pleased to inform you that latest issue of scientific and technical journal "Proceedings of Universities. Electronics", vol. 28, no. 4, 2023 has been published on August 18, 2023.

30.06.2023 Vol. 28, no. 3, 2023 has been published

Dear colleagues!
We are pleased to inform you that latest issue of scientific and technical journal "Proceedings of Universities. Electronics", vol. 28, no. 3, 2023 has been published on June 28, 2023.

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